Advantest Introduces T5503 High Throughput Memory Test System

The T5503 was developed specifically to address the challenges of high-volume production test of next-generation high-speed DDR3-SDRAM memory. The introduction of the T5503 reinforces Advantest’s market leadership in delivering advanced technology solutions for its global customers’ next-generation test requirements…


Share this article!

    Related posts:

    1. Advantest Announces T5503 High Throughput Memory Test System
    2. Advantest Announces 266MHz T5782 Memory Test System for Flash, Embedded Microcontrollers and Bus Environtment Memory
    3. Virage Logic Announces RTL to Test Floor Embedded Memory Test and Repair Subsystem Based on STAR
    4. Aeroflex Introduces 4520 High Speed and High Accuracy Fixtureless Test in Stand Alone Platform
    5. Teradyne Announces Magnum II Memory Test Solution with Higher Speeds and Performance
    Terms: