Agilent Announces Comprehensive Solution for Testing SuperSpeed USB 3.0 Devices
By pur, Tuesday, November 25th, 2008
Category: Embedded Device, Measurement, Instrumentation, Storage
At the first USB 3.0 Developers Conference in San Jose, Calif., Agilent demonstrated its new USB 3.0 transmitter and USB 3.0 receiver compliance test solutions. This demonstration included the industry’s first USB 3.0 signal quality test fixture. The complete solution enables engineers to quickly and accurately test their USB 3.0 designs. SuperSpeed USB 3.0 will deliver 10 times the data transfer rate of USB 2.0 and make power usage more efficient. SuperSpeed USB will be necessary for data-storage devices transferring more than 25 Gbps. The Agilent USB 3.0 transmitter compliance test application and the USB 3.0 signal quality test fixture will be released once the official silicon is available for certification, which is expected in February 2009…
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