The XJTAG development system is being used by engineers at CRFS’s design facility in Cambridge, England, to speed up debug and test of ball grid array (BGA) populated printed circuits boards which form part of the RFeye system. XJTAG is also being used to create test harnesses to improve coverage during production testing at CRFS’s contract manufacturing partner’s site. XJTAG’s appeal is also its versatility. It is designed to be used right throughout the product lifecycle from design and development through to the factory floor and beyond. XJTAG provides the ability to re-use and port test scripts between circuit boards which saves us loads of time…

CRFS selects XJTAG boundary scan to speed development of RFeyeTM spectrum monitoring system

XJTAG used to speed test and debug of BGA-populated printed circuit boards; and to create test harnesses to improve coverage during production.
XJTAG selected due to its incredible speed, the ability to test JTAG and non-JTAG devices, and the extensive library of re-usable test scripts.

The SMM151/2/3 family provides Digital Power Management via an I2C interface and non-volatile memory allowing the user to retrieve real-time parametric information (voltage/current) and configure power functions, such as: glitch filter duration for ignoring spurious noise signals, margin delay, margin high and low limits, GPIO power-up polarity, voltage monitoring mode (under-voltage or over-voltage) and device handling of fault conditions. The SMM151/2/3 family is supported by Summit’s easy-to-use PC-based graphical (GUI) development environment that allows system designers to digitally program the output power supply, read current and voltage information and control a variety of power management functions with a few clicks of a mouse. In high-volume production Summit provides product that is pre-programmed with the customer’s “custom configuration” at no extra cost…

Summit’s Programmable Environmental Monitor Provides Real-time Power Information and Enables Green System Designs

Real-time output voltage and input current monitoring allows for sophisticated power control, while output voltage margining maximizes system reliability

iTest 3.2 is a comprehensive testing solution for device and heterogeneous system testing. As the complexity of devices has increased, so has the market demand for vendor-agnostic integration between test equipment and test automation software. With iTest 3.2, customers can seamlessly integrate test assets and automate complex system testing using hardware and software from a variety of different vendors. iTest provides an agnostic testing solution that unifies all of the different pieces of the increasingly complex testing puzzle…

Fanfare Announces iTest 3.2

New Edition Enables Sophisticated System Testing While Improving Productivity and Quality

Fanfare, delivering innovative testing solutions to network equipment manufacturers (NEMs), service providers (SPs), and enterprises announced the latest release of iTest[tm], the company’s flagship test automation product. iTest 3.2 is a comprehensive testing solution for device and heterogeneous system testing. As the complexity of devices has increased, so has the market demand for vendor-agnostic integration between test equipment and test automation software. With iTest 3.2, customers can seamlessly integrate test assets and automate complex system testing using hardware and software from a variety of different vendors.