Verigy Installs V93000 Port Scale RF Tester for Next-Generation Long Term Evolution Broadband Data and Telephony Chips

By pur, Wednesday, December 9th, 2009
Category: IC, Chip, SoC, Measurement, Instrumentation, Networking, RF, Radio, Semiconductor

A key strength of Verigy’s V93000 platform is its ability to test a wide range of devices, including RF and baseband. This enables users to achieve higher utilization rates than they can with application-specific test systems. In addition, the V93000’s excellent modulation/demodulation performance at higher data rates makes it especially well-suited for testing advanced semiconductor devices, such as those required in 4G networks.The upgrade to 4G wireless networks is being driven largely by an insatiable market demand for faster data transmission rates than existing 3G networks can provide. The two standards being considered for 4G networks are LTE, which originated in the Third Generation Partnership Project (3GPP), and WiMax (IEEE 802.16e/m), which has its roots in the WLAN market. Both of these technologies use advanced Orthogonal Frequency Division Multiple Access (OFDMA) modulation…

Verigy-V93000

Verigy’s V93000
(Photo: Verigy)


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